Flex Circuits

Flex circuit technologies pose a wide range of metrology challenges with a large number of different circuit geometries, pitch dimensions, and surface reflectivity factors. To meet these challenges, metrology systems for flex circuit inspection must incorporate advanced functionality such as versatile lighting, large-size stages, high-resolution positioning, and very accurate laser probe capabilities.

VIEW Engineering’s proven Pinnacle, Benchmark and Summit family of systems, with dual magnification optics and integrated lasers, can provide an ideal environment for implementing advanced flex circuit inspection applications.